Testing and Diagnosis of VLSI and ULSI

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Testing and Diagnosis of VLSI and ULSI

Testing and Diagnosis of VLSI and ULSI

F. Lombardi, M.G. Sami

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ఈ పుస్తకం ఎంతగా నచ్చింది?

దింపుకొన్న ఫైల్ నాణ్యత ఏమిటి?

పుస్తక నాణ్యత అంచనా వేయడాలనుకుంటే దీన్ని దింపుకోండి

దింపుకొన్న ఫైళ్ళ నాణ్యత ఏమిటి?

వర్గాలు:

సంవత్సరం:

1988

ముద్రణం:

1

ప్రచురణకర్త:

Springer

భాష:

english

పేజీల సంఖ్య:

533

ISBN 10:

902473794X

ISBN 13:

9789024737949

పుస్తక శ్రేణి:

NATO Science Series E:

ఫైల్:

DJVU, 5.49 MB

IPFS:

,

english, 1988

ఆన్‌లైన్‌లో చదవండి

కి మార్పిడి జరుగుతూ ఉంది.

కి మార్పిడి విఫలమైంది!

మీకు ఆసక్తిగా కనిపించ వచ్చు

Y. Shacham-Diamand (auth.), Yosi Shacham-Diamand, Tetsuya Osaka, Madhav Datta, Takayuki Ohba (eds.) — Advanced Nanoscale ULSI Interconnects: Fundamentals and Applications

Hurst, Stanley Leonard — VLSI testing : digital and mixed analogue/digital techniques

Charles E. Stroud (auth.) — A Designer’s Guide to Built-In Self-Test

G. Russell, I. Sayers — Advanced Simulation and Test Methodols for VLSI Design

M. Bushnell, V. Agrawal — Essentials of Electronic Testing - For Digital, Memory and Mixed-Signal VLSI Circuits

Unknown — "Automatic Testing". In: Wiley Encyclopedia of Electrical and Electronics Engineering

SRINIVAS, SRINIVAS DEVADAS ABHIJIT GHOSH KURT KEUTZER, Pdg2Pic — LOGIC SYNTHESIS

Frank F. Tsui — Lsi/Vlsi Testability Design

Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen — VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon)

Marg Karpovsky (Eds.) — Spectral Techniques and Fault Detection

A F Schwarz — Handbook of VLSI chip design and expert systems

Francis C. Wang — Digital Circuit Testing: A Guide to DFT and Other Techniques

William J. Dally — Advanced Research in VLSI: Proceedings of the 6th MIT Conference

Hideo Fujiwara — Logic testing and design for testability

Carlo H. Séquin — Advanced Research in VLSI: Proceedings of the 1991 University of California - Santa Cruz Conference (M I T Conference on Advanced Research in V L S I Advanced Research in V L S I)

written by Katarzyna Radecka, Zeljko Zilic. — Emerging Nanotechnologies -Test Defect Tolerance and Reliability -SP

Prithviraj Kabisatpathy, Alok Barua, Satyabroto Sinha — Fault Diagnosis of Analog Integrated Circuits (Frontiers in Electronic Testing)

Mohammad Tehranipoor — Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability (Frontiers in Electronic Testing) (Frontiers in Electronic Testing)

Reiner W. Hartenstein — Hardware Description Languages

John G. Webster (Editor) — 13.Computer-Aided Design of Integrated Circuits

Alexander Miczo — Digital Logic Testing and Simulation

Frederick J. Hill, Gerald R. Peterson — Computer Aided Logical Design with Emphasis on VLSI

N. K. Jha, S. Gupta — Testing of Digital Systems

J B Gosling — Simulation in the design of digital electronic systems

John B. Gosling — Simulation in the Design of Digital Electronic Systems

Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman — Digital Systems Testing & Testable Design

M. Bushnell; Vishwani Agrawal — Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

M. Bushnell, Vishwani Agrawal — Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits

Kwang-Ting (Tim) Cheng, Vishwani D. Agrawal — Unified Methods for VLSI Simulation and Test Generation

Taylor, Gaynor E.; Russell, Gordon — Algorithmic and knowledge based CAD for VLSI

George W. Zobrist — VLSI Fault Modeling and Testing Techniques:

Vasant B. Rao, David V. Overhauser, Timothy N. Trick, Ibrahim N. Hajj — Switch-Level Timing Simulation of MOS VLSI Circuits

Charles E. Stroud — A Designer s Guide to Built-in Self-Test

Zainalabedin Navabi (auth.) — Digital System Test and Testable Design: Using HDL Models and Architectures

Joe E. Brewer (auth.), Earl E. Swartzlander Jr. (eds.) — Wafer Scale Integration

Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushneil (auth.) — Neural Models and Algorithms for Digital Testing

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