Intellectual Property Damages: Guidelines and Analysis
Mark A. Glick, Lara A. Reymann, Hoff Richard
A comprehensive resource for anyone involved in intellectual property litigationWith Intellectual Property Damages you'll get the basics of the intellectual property litigation process, the essential "rules" in postulating damages theories, the basics of IP law, the economic policies that are the foundation for much of IP litigation, the skills necessary to correctly calculate damages in IP cases--and more!Order your copy today!
సంవత్సరం:
2002
ముద్రణం:
1
భాష:
english
పేజీల సంఖ్య:
504
ISBN 10:
0471449474
ISBN 13:
9780471449478
ఫైల్:
PDF, 2.00 MB
IPFS:
,
english, 2002